The Absolute Luminescence Quantum Yield System
When developing opto-electronic devices, such as LEDs or solar cells, it is essential to improve their radiative efficiency. This requires precise techniques to determine the luminescence quantum yield. The LumY Pro is an easy-to-use, non-invasive and versatile system with unparalleled compactness to swiftly quantify absolute electro- and photoluminescence photon fluxes of thin film absorbers, layer stacks or complete devices under various operating conditions.
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System & Layout
Quality assessment for rapid Process Control after each fabrication step or for Accelerated Material and Process Parameter Screenings.
Fast Acquisition resolves Shifts in Emission Spectrum & Intensity as well as EL/PLQY and QFLS on timescales from 10 ms to several hours.
Resolve Bulk & Interface Recombination
Quantifying Bulk and Interface Recombination Losses in semiconductor thin films, layer stacks or complete devices such as solar cells or LEDs. Examples in academic publications can be found in [1-6].
Efficiency Potentials & Loss Mechanisms
In-depth analysis of efficiency potentials and loss mechanisms in semiconductor thin films, layer stacks or complete devices, e.g. by determining Ideality Factors and Pseudo-JV Curves from Intensity and/or Bias-Voltage Dependent EL/PLQY & QFLS. Also see [7-9]
Current-voltage source and measure unit (SMU) max. ratings
+/-10 V, +/-150 mA
Max. sample dimensions (L x W, unrestricted height)
30 x 30 mm
Max. no. of contactable subcells on sample by integrated relais box
Photoexcitation intensity (continuously adjustable)
0.001 – 10 “Suns”
Photoexcitation spot size (interchangeable)
0.1 cm² / 1 cm²
Spectral detection range
500 – 1100 nm
Quantum yield sensitivity range
10-4 – 100%
Corresponding min. resolvable QFLS for 1.6 eV absorber band gap
Spectrometer integration time
1 ms – 65 s
Dimensions (L x W x H)
220 x 195 x 120 mm
1x DC, 1x USB 3.0
Our team is a multi-disciplinary group of researchers from the Helmholtz-Zentrum Berlin (PIs, Postdocs & PhD students) with great expertise in:
- Perovskite based tandem solar cells
- Advanced spectroscopy on perovskite films and devices
- Absolute photo- & electroluminescence measurements (recombination loss analysis)
We have been frequently using and promoting absolute luminescence measurements throughout recent years. The method enormousely helped us to develop efficient solar cell materials and greatly accelerated the device development. In fact, absolute luminescence measurements were the key characterization technique enabling us to realize a world record certified perovskite/silicon tandem solar cell efficiency of 29.15% in January 2020.
References marked with ‡ indicate publications with contributions from members of our team.
Resolving bulk and interface recombination losses from absolute PL:
‡ Unold et al., Advanced Characterization Techniques for Thin Film Solar Cells, Chapter 7: Photoluminescence Analysis of Thin-Film Solar Cells, Wiley, 2011, ISBN: 9783527410033
‡ Al-Ashouri et al., Energy Environ. Sci., 2019, 12, 3356-3369
‡ Kegelmann et al., ACS Appl. Mater. Interfaces, 2019, 11, 9, 9172-9181
‡ Stolterfoht et al., Energy Environ. Sci., 2019, 12, 2778-2788
‡ Liu et al., ACS Energy Lett., 2019, 4, 1, 110-117
‡ Kirchartz et al., Adv. Energy Mater., 2020, Early View 1904134.
Ideality factor and pseudo-JV curves from light-intensity dependent absolute PL:
‡ Caprioglio et al., Adv. Energy Mater., 2019, 9, 33, 110-117
‡ Stolterfoht et al., Adv. Mater., 2020, DOI: 10.1002/adma.202000080
 Chris Dreessen et al., Journal of Luminescence, 2020, 222, 117106
Dr. Lukas Kegelmann